The above image is a cross section of a sputtered copper film on the order of 25 um thick captured at 2,000X magnification. The speed improvements that were made to the SEM_control software have been a huge help. It is now much easier to navigate around the sample and focus the beam. This, in addition to a lot of operator improvements have helped to obtain the highest resolution image taken yet! I have been learning to use the final aperture, the spot size and the beam alignment, helping to push the instrument into the range of being a useful microscope.
I would also like to acknowledge the help I’ve received from the users of the Microscopy Listserver. Many thanks to them for their advice on microscope settings, disassembly and cleaning.